Project 11: Modelling and Simulation of Debris Attachment on the CMM Stylus and the Impact on Measurement Accuracy
Home Project 11: Modelling and Simulation of Debris Attachment on the CMM Stylus and the Impact on Measurement Accuracy
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01 Introduction
02 Laboratories
03 Eligibility
04 Apply
05 Fee
06 Others
07 Life@SJTU
08 Practical Information

Program Fee

Application fee (non-refundable)                  400RMB